SPIE Proceedings [SPIE SPIE's 1995 International Symposium on Optical Science, Engineering, and Instrumentation - San Diego, CA (Sunday 9 July 1995)] X-Ray and Extreme Ultraviolet Optics - AXAF VETA-I mirror x-ray test results cross-check with the HDOS metrology data
Zhao, Ping, Van Speybroeck, Leon P., Hoover, Richard B., Walker, Jr., Arthur B. C.Volume:
2515
Year:
1995
Language:
english
DOI:
10.1117/12.212604
File:
PDF, 551 KB
english, 1995