SPIE Proceedings [SPIE SPIE Proceedings - (Sunday 12 February 2012)] - Observing diamond defects with an analytical color-fluorescence electron microscope
Nishimura, Kazuhito, Nakano, Tohru, Koike, Hirotami, Tomimori, Hiroshi, Kawarada, Hiroshi, Hiraki, Akio, Ogawa, Kazuo, Feldman, Albert, Holly, SandorYear:
2012
Language:
english
DOI:
10.1117/12.22472
File:
PDF, 1.17 MB
english, 2012