SPIE Proceedings [SPIE International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics - Kiev, Ukraine (Thursday 11 May 1995)] International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics - Evaluation of the measuring errors of the surface properties of substances with an optical-digital diagnostic system
Muravsky, Leonid I., Batchevsky, Roman S., Stefansky, Arkadiy I., Svechnikov, Sergey V., Valakh, Mikhail Y.Volume:
2648
Year:
1995
Language:
english
DOI:
10.1117/12.226240
File:
PDF, 147 KB
english, 1995