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SPIE Proceedings [SPIE SPIE's International Symposium on Optical Science, Engineering, and Instrumentation - San Diego, CA (Sunday 19 July 1998)] X-Ray Microfocusing: Applications and Techniques - Using x-ray microprobes for environmental research
Kemner, Ken M., Yun, Wenbing, Cai, Zhonghou, Lai, Barry P., Lee, Heung-Rae, Legnini, Dan G., Rodrigues, W., Jastrow, Julie D., Miller, R. M., Pratt, Stephan T., Schneegurt, M. A., Kulpa, Jr., C. F., SVolume:
3449
Year:
1998
Language:
english
DOI:
10.1117/12.330354
File:
PDF, 1.59 MB
english, 1998