SPIE Proceedings [SPIE Optics and Optoelectronic Inspection...

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SPIE Proceedings [SPIE Optics and Optoelectronic Inspection and Control: Techniques, Applications, and Instruments - Beijing, China (Wednesday 8 November 2000)] Optical Measurement and Nondestructive Testing: Techniques and Applications - Several key techniques in the PIV system

Tang, Hongwu, Yang, Yong, Xu, Youren, Gao, Xinling, Song, FeiJun, Chen, Frank, Hung, Michael Y.Y., Shang, H.M.
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Volume:
4221
Year:
2000
Language:
english
DOI:
10.1117/12.402655
File:
PDF, 256 KB
english, 2000
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