![](/img/cover-not-exists.png)
SPIE Proceedings [SPIE Intelligent Systems and Smart Manufacturing - Boston, MA (Sunday 5 November 2000)] Machine Vision and Three-Dimensional Imaging Systems for Inspection and Metrology - Scaling a 3D vision system from automobiles down to circuit board inspection: issues in small field-of-view inspection
Veatch, Phillip, Kivanc Bas, Ender, Stoops, David, Harding, Kevin G., Miller, John W. V., Batchelor, Bruce G.Volume:
4189
Year:
2001
Language:
english
DOI:
10.1117/12.417207
File:
PDF, 730 KB
english, 2001