SPIE Proceedings [SPIE Optical Engineering for Sensing and Nanotechnology (ICOSN '01) - Yokohama, Japan (Wednesday 6 June 2001)] Optical Engineering for Sensing and Nanotechnology (ICOSN 2001) - High-order birefringence and dispersion measurement using spectroscopy of polarized light
Wakayama, Toshitaka, Kowa, Hiroyuki, Otani, Yukitoshi, Umeda, Norihiro, Yoshizawa, Toru, Iwata, KoichiVolume:
4416
Year:
2001
Language:
english
DOI:
10.1117/12.427032
File:
PDF, 252 KB
english, 2001