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SPIE Proceedings [SPIE Electronic Imaging 2002 - San Jose, CA (Saturday 19 January 2002)] Machine Vision Applications in Industrial Inspection X - Photometric model and roughness characterization for 3D microtextures analysis
Brochard, Jacques, Khoudeir, Majdi, Legeay, Vincent, Do, Min-Tan, Hunt, Martin A.Volume:
4664
Year:
2002
Language:
english
DOI:
10.1117/12.460193
File:
PDF, 239 KB
english, 2002