SPIE Proceedings [SPIE Photonics Asia 2002 - Shanghai, China (Monday 14 October 2002)] Optical Information Processing Technology - Error analysis and correcting 3D profilometry based on quadrature demodulation
Su, Ting, Zhang, Yong-Lin, Mu, Guoguang, Yu, Francis T. S., Jutamulia, SugandaVolume:
4929
Year:
2002
Language:
english
DOI:
10.1117/12.483260
File:
PDF, 504 KB
english, 2002