SPIE Proceedings [SPIE Seventh International Symposium on Laser Metrology Applied to Science, Industry, and Everyday Life - Novosibirsk, Russia (Monday 9 September 2002)] Seventh International Symposium on Laser Metrology Applied to Science,Industry, and Everyday Life - Use of the method of local anisotropic features for symbolic image recognition
Borisova, Irina V., Finogenov, L. V., Gorenok, V. N., Kazikin, A. E., Plekhanova, I. V., Popov, Pavel G., Schulman, Yu. S., Verkhogliad, Alexander G., Chugui, Yuri V., Bagayev, Sergei N., Weckenmann,Volume:
4900
Year:
2002
Language:
english
DOI:
10.1117/12.484622
File:
PDF, 479 KB
english, 2002