SPIE Proceedings [SPIE Optical Metrology - Munich, Germany (Monday 23 June 2003)] Optical Measurement Systems for Industrial Inspection III - Low-coherent probing of scattering media with use of speckle contrast analysis
Trifonov, Valery A., Osten, Wolfgang, Kujawinska, Malgorzata, Zimnyakov, Dmitry A., Creath, KatherineVolume:
5144
Year:
2003
Language:
english
DOI:
10.1117/12.500022
File:
PDF, 401 KB
english, 2003