SPIE Proceedings [SPIE Photonics Europe - Strasbourg, France (Monday 26 April 2004)] Optical Metrology in Production Engineering - Evaluation of a residual stresses measurement device combining a radial in-plane ESPI and the blind hole drilling method
Albertazzi G., Jr., Armando, Osten, Wolfgang, Takeda, Mitsuo, Peixoto Filho, Flavio T., Suterio, Ricardo, Kleber Amaral, FelipeVolume:
5457
Year:
2004
Language:
english
DOI:
10.1117/12.547269
File:
PDF, 1.53 MB
english, 2004