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SPIE Proceedings [SPIE Optical Science and Technology, the SPIE 49th Annual Meeting - Denver, CO (Monday 2 August 2004)] Optical Systems Degradation, Contamination, and Stray Light: Effects, Measurements, and Control - Stray light estimates for the TPF formation flying interferometer
Noecker, Charley, Wei, Zongying, Decino, James, Chen, Philip T. C., Fleming, John C., Dittman, Michael G.Volume:
5526
Year:
2004
Language:
english
DOI:
10.1117/12.593647
File:
PDF, 425 KB
english, 2004