SPIE Proceedings [SPIE Semiconductors '92 - Somerset, NJ (Sunday 22 March 1992)] Spectroscopic Characterization Techniques for Semiconductor Technology IV - Effect of annealing on Fermi level pinning of low-temperature molecular-beam epitaxial GaAs
Shen, Hongen, Pamulapati, Jagadeesh, Lux, Robert A., Dutta, Mitra B., Rong, F. C., Taysing-Lara, Monica A., Fotiadis, L., Calderon, L., Lu, Yicheng, Glembocki, Orest J.Volume:
1678
Year:
1992
Language:
english
DOI:
10.1117/12.60458
File:
PDF, 426 KB
english, 1992