SPIE Proceedings [SPIE Optical Metrology - Munich, Germany (Monday 18 June 2007)] Optical Measurement Systems for Industrial Inspection V - Simulation of the elastic wave propagation in anisotropic microstructures
Bryner, Juerg, Osten, Wolfgang, Gorecki, Christophe, Vollmann, Jacqueline, Profunser, Dieter M., Novak, Erik L., Dual, JurgVolume:
6616
Year:
2007
Language:
english
DOI:
10.1117/12.726132
File:
PDF, 899 KB
english, 2007