SPIE Proceedings [SPIE Electronic Imaging 2008 - San Jose, CA (Sunday 27 January 2008)] Image Processing: Machine Vision Applications - Directional filter banks for detecting un-patterned TFT-LCD defect
Park, No Kap, Niel, Kurt S., Fofi, David, Kim, Hye Won, Yoo, Suk InVolume:
6813
Year:
2008
Language:
english
DOI:
10.1117/12.766182
File:
PDF, 695 KB
english, 2008