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SPIE Proceedings [SPIE International Conference of Optical Instrument and Technology - Beijing, China (Sunday 16 November 2008)] 2008 International Conference on Optical Instruments and Technology: Optical Systems and Optoelectronic Instruments - An apparatus for the measurement of spectral specular reflectance of spot area in curved surfaces
Zheng, Xiaodong, Sheng, Yunlong, Wang, Yongtian, Wang, Zheng, Zhao, Yaodong, Zeng, LijiangVolume:
7156
Year:
2008
Language:
english
DOI:
10.1117/12.807105
File:
PDF, 327 KB
english, 2008