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SPIE Proceedings [SPIE SPIE OPTO: Integrated Optoelectronic Devices - San Jose, CA (Saturday 24 January 2009)] Optical Components and Materials VI - Exceptionally large area photodetection
Jiang, Shibin, Howorth, Jon, Hay, Nigel, Digonnet, Michel J. F., Glesener, John W., Cant, B. A., Monastyrskiy, M. A., Dries, J. Christopher, Greenfield, D. E., Joseph, Charles L.Volume:
7212
Year:
2009
Language:
english
DOI:
10.1117/12.808793
File:
PDF, 796 KB
english, 2009