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SPIE Proceedings [SPIE International Conference on Image Processing and Pattern Recognition in Industrial Engineering - Xi'an, China (Saturday 7 August 2010)] International Conference on Image Processing and Pattern Recognition in Industrial Engineering - A new license plate extraction framework based on fast mean shift
Pan, Luning, Du, Zhengyu, Liu, Bin, Li, ShuguangVolume:
7820
Year:
2010
Language:
english
DOI:
10.1117/12.867250
File:
PDF, 3.52 MB
english, 2010