SPIE Proceedings [SPIE 1983 International Techincal...

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SPIE Proceedings [SPIE 1983 International Techincal Conference/Europe - Geneva, Switzerland (Monday 18 April 1983)] Advances in Laser Scanning and Recording - Method For Measuring Rotating Scanner Parameters

Allegro, G., Mazzocato, C., Meazza, G., Virano, A., Beiser, Leo
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Volume:
396
Year:
1983
Language:
english
DOI:
10.1117/12.935256
File:
PDF, 2.52 MB
english, 1983
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