SPIE Proceedings [SPIE 1983 International Techincal Conference/Europe - Geneva, Switzerland (Monday 18 April 1983)] Advances in Laser Scanning and Recording - Method For Measuring Rotating Scanner Parameters
Allegro, G., Mazzocato, C., Meazza, G., Virano, A., Beiser, LeoVolume:
396
Year:
1983
Language:
english
DOI:
10.1117/12.935256
File:
PDF, 2.52 MB
english, 1983