![](/img/cover-not-exists.png)
SPIE Proceedings [SPIE Semiconductor Conferences - Bay Point, FL (Monday 23 March 1987)] Characterization of Very High Speed Semiconductor Devices and Integrated Circuits - Picosecond Photoemission Sampling For Contactless High Speed Integrated Circuit Diagnostics
Blacha, A., Clauberg, R., Seitz, H., Wolz, W., Beha, H., Jain, Ravinder K.Volume:
795
Year:
1988
Language:
english
DOI:
10.1117/12.940949
File:
PDF, 510 KB
english, 1988