SPIE Proceedings [SPIE 1984 Technical Symposium East - Arlington (Tuesday 1 May 1984)] Optical Technology for Microwave Applications I - Thin-Film Lens Technology Applied To Integrated Optical Spectrum Analyzers
Hickernell, F. S., Ruehle, K. D., Yao, Shi-KayVolume:
477
Year:
1984
Language:
english
DOI:
10.1117/12.942630
File:
PDF, 218 KB
english, 1984