SPIE Proceedings [SPIE 1985 Technical Symposium East -...

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SPIE Proceedings [SPIE 1985 Technical Symposium East - Arlington (Wednesday 10 April 1985)] Image Quality: An Overview - Versatile Projector Test Device - Concept, Realisation, Results

Kross, J., Schonfelder, T., Baker, Lionel R., Granger, Edward M.
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Volume:
549
Year:
1985
Language:
english
DOI:
10.1117/12.948811
File:
PDF, 3.17 MB
english, 1985
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