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SPIE Proceedings [SPIE 1980 Los Angeles Technical Symposium - Los Angeles (Monday 4 February 1980)] Advances in Focal Plane Technology - Problems In Measuring Performance Of Staring Infrared (IR) Focal Planes
Merriam, J. D., Bentley, R. K., Chan, William S.Volume:
217
Year:
1980
Language:
english
DOI:
10.1117/12.958491
File:
PDF, 153 KB
english, 1980