SPIE Proceedings [SPIE Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies 2012 - Constanta, Romania (Thursday 23 August 2012)] Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies VI - Analyzing the functionality of a scanner
Toadere, Florin, Schiopu, Paul, Tamas, RazvanVolume:
8411
Year:
2012
Language:
english
DOI:
10.1117/12.966343
File:
PDF, 281 KB
english, 2012