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A defect tolerant self-organizing nanoscale SIMD architecture
Patwardhan, Jaidev P., Johri, Vijeta, Dwyer, Chris, Lebeck, Alvin R.Volume:
41
Language:
english
Journal:
ACM SIGPLAN Notices
DOI:
10.1145/1168918.1168888
Date:
October, 2006
File:
PDF, 618 KB
english, 2006