Confidence Intervals and an Improved Ridge Analysis of...

Confidence Intervals and an Improved Ridge Analysis of Response Surfaces

Walter H. Carter, Jr., Vernon M. Chinchilli, Raymond H. Myers and Eleanor D. Campbell
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Volume:
28
Language:
english
Journal:
Technometrics
DOI:
10.2307/1268983
Date:
November, 1986
File:
PDF, 984 KB
english, 1986
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