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Confidence Intervals and an Improved Ridge Analysis of Response Surfaces
Walter H. Carter, Jr., Vernon M. Chinchilli, Raymond H. Myers and Eleanor D. CampbellVolume:
28
Language:
english
Journal:
Technometrics
DOI:
10.2307/1268983
Date:
November, 1986
File:
PDF, 984 KB
english, 1986