Statistical analysis on the effect of capacitance mismatch...

IEEJ Transactions on Electrical and Electronic Engineering 2011 Vol. 6; Iss. S1

Statistical analysis on the effect of capacitance mismatch in a high-resolution successive-approximation ADC

Tsutomu Wakimoto, Hongxing Li, Keita Murase
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Volume:
6
Year:
2011
Language:
english
Pages:
1
DOI:
10.1002/tee.20625
File:
PDF, 138 KB
english, 2011
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