![](/img/cover-not-exists.png)
EXAFS measurements at the micrometer-scale spatial resolution using achromatic multilayer-based focusing optics
E. Ziegler, G. Aquilanti, O. Mathon, S. de Panfilis, P. van VaerenberghVolume:
38
Year:
2009
Language:
english
Pages:
4
DOI:
10.1002/xrs.1154
File:
PDF, 343 KB
english, 2009