Metallic thin film thickness determination using electron probe microanalysis
C. S. Campos, E. A. Coleoni, J. C. Trincavelli, J. Kaschny, R. Hubbler, M. R. F. Soares, M. A. Z. VasconcellosVolume:
30
Year:
2001
Language:
english
Pages:
7
DOI:
10.1002/xrs.495
File:
PDF, 243 KB
english, 2001