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Synchrotron x-ray fluorescence and secondary ion mass spectrometry in tree ring microanalysis: applications to dendroanalysis
R. R. Martin, T. K. Sham, G Wong Won, K. W. Jones, H. FengVolume:
30
Year:
2001
Language:
english
Pages:
4
DOI:
10.1002/xrs.507
File:
PDF, 150 KB
english, 2001