Application of the backscatter fundamental parameter method for in situ element determination using a portable energy-dispersive x-ray fluorescence spectrometer
Dariusz Wegrzynek, Andrzej Markowicz, Ernesto Chinea-CanoVolume:
32
Year:
2003
Language:
english
Pages:
10
DOI:
10.1002/xrs.626
File:
PDF, 219 KB
english, 2003