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SPIE Proceedings [SPIE Applications in Optical Science and Engineering - Boston, MA (Sunday 15 November 1992)] Industrial Applications of Optical Inspection, Metrology, and Sensing - Integration of ESPI and structural analysis to determine the impact of structural defects
Garcia, Gabriel V., Matthews, Larryl K., Hickman, L. M., Brown, Gordon M., Harding, Kevin G., Stahl, H. PhilipVolume:
1821
Year:
1993
Language:
english
DOI:
10.1117/12.145576
File:
PDF, 361 KB
english, 1993