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SPIE Proceedings [SPIE Electronic Imaging Device Engineering - Munich, Federal Republic of Germany (Monday 21 June 1993)] Computer Vision for Industry - Study of Fourier descriptors statistical features
Darwish, Ahmed M., Mohamed, Emad-Eldin H., Braggins, Donald W.Volume:
1989
Year:
1993
Language:
english
DOI:
10.1117/12.164861
File:
PDF, 389 KB
english, 1993