SPIE Proceedings [SPIE SPIE's 1994 International Symposium on Optics, Imaging, and Instrumentation - San Diego, CA (Sunday 24 July 1994)] Cargo Inspection Technologies - Statistical and operational considerations for designs for x-ray interrogation systems to detect, localize, discriminate, and identify defects and inclusions which lead to functional breakdown in electric (microelectronic I/Cs), biophysical (human tissue), and transportation (luggage and cargo) systems