SPIE Proceedings [SPIE ISPDI 2013 - Fifth International Symposium on Photoelectronic Detection and Imaging - Beijing, China (Tuesday 25 June 2013)] International Symposium on Photoelectronic Detection and Imaging 2013: Laser Sensing and Imaging and Applications - Error separation technique for measuring aspheric surface based on dual probes
Wei, Zhong-wei, Jing, Hong-wei, Kuang, Long, Wu, Shi-bin, Amzajerdian, Farzin, Aksnes, Astrid, Chen, Weibiao, Gao, Chunqing, Zheng, Yongchao, Wang, ChengVolume:
8905
Year:
2013
Language:
english
DOI:
10.1117/12.2034649
File:
PDF, 528 KB
english, 2013