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SPIE Proceedings [SPIE SPIE BiOS - San Francisco, California, United States (Saturday 1 February 2014)] Optical Diagnostics and Sensing XIV: Toward Point-of-Care Diagnostics - High resolution coherence domain depth-resolved nailfold capillaroscopy based on correlation mapping optical coherence tomography
Coté, Gerard L., Subhash, Hrebesh M., O'Gorman, Sean, Neuhaus, Kai, Leahy, MartinVolume:
8951
Year:
2014
Language:
english
DOI:
10.1117/12.2038550
File:
PDF, 295 KB
english, 2014