SPIE Proceedings [SPIE Photonics East '99 - Boston, MA (Sunday 19 September 1999)] Machine Vision Systems for Inspection and Metrology VIII - Development of automated optical verification technologies for control systems
Volegov, Peter L., Podgornov, Vladimir A., Miller, John W. V., Solomon, Susan S., Batchelor, Bruce G.Volume:
3836
Year:
1999
Language:
english
DOI:
10.1117/12.360272
File:
PDF, 312 KB
english, 1999