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SPIE Proceedings [SPIE SPIE's International Symposium on Optical Science, Engineering, and Instrumentation - Denver, CO (Sunday 18 July 1999)] X-Ray Optics Design, Performance, and Applications - Sub-μrad angular stability measurements by use of long-trace-profiler-based systems

Qian, Shinan, Takacs, Peter Z., Khounsary, Ali M., Freund, Andreas K., Ishikawa, Tetsuya, Srajer, George, Lang, Jonathan C.
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Volume:
3773
Year:
1999
Language:
english
DOI:
10.1117/12.370088
File:
PDF, 538 KB
english, 1999
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