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SPIE Proceedings [SPIE SPIE's International Symposium on Optical Science, Engineering, and Instrumentation - Denver, CO (Sunday 18 July 1999)] Ultraviolet and X-Ray Detection, Spectroscopy, and Polarimetry III - Calibration facility in the XUV region for reflective optics
Malvezzi, Andrea M., Secondi, Gianluca, Fineschi, Silvano, Woodgate, Bruce E., Kimble, Randy A.Volume:
3764
Year:
1999
Language:
english
DOI:
10.1117/12.371093
File:
PDF, 276 KB
english, 1999