SPIE Proceedings [SPIE Lasers in Metrology and Art...

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SPIE Proceedings [SPIE Lasers in Metrology and Art Conservation - Munich, Germany (Monday 18 June 2001)] Optical Measurement Systems for Industrial Inspection II: Application in Industrial Design - Speckle index in dynamic processes: application to drying of paint

Trivi, Marcelo, Rabal, Hector J., Cap, Nelly L., Arizaga, Ricardo A., Osten, Wolfgang, Jueptner, Werner P. O., Kujawinska, Malgorzata
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Volume:
4398
Year:
2001
Language:
english
DOI:
10.1117/12.445550
File:
PDF, 231 KB
english, 2001
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