SPIE Proceedings [SPIE OPTO Ireland - Galway, Ireland (Thursday 5 September 2002)] Opto-Ireland 2002: Optical Metrology, Imaging, and Machine Vision - Image PSF-matching and subtraction: a powerful astronomical technique and its application to industrial imaging
Butler, Raymond F., O'Tuairisg, Seathrun, Shearer, Andrew, Golden, Aaron, Shearer, Andrew, Murtagh, Fionn D., Mahon, James, Whelan, Paul F.Volume:
4877
Year:
2003
Language:
english
DOI:
10.1117/12.463684
File:
PDF, 739 KB
english, 2003