SPIE Proceedings [SPIE Symposium on Integrated Optoelectronic Devices - San Jose, CA (Friday 18 January 2002)] Photodetector Materials and Devices VII - Quantitative secondary ion mass spectrometry (SIMS) of III-V materials
Van Lierde, Patrick, Tian, Chunsheng, Rothman, Bruce, Hockett, Richard A., Brown, Gail J., Razeghi, ManijehVolume:
4650
Year:
2002
Language:
english
DOI:
10.1117/12.467668
File:
PDF, 64 KB
english, 2002