![](/img/cover-not-exists.png)
SPIE Proceedings [SPIE Photonics Asia 2002 - Shanghai, China (Monday 14 October 2002)] Advanced Materials and Devices for Sensing and Imaging - Optical negative resistance detector with LBT structure
Guo, Weilian, Zheng, Yunguang, Li, Shurong, Mao, Luhong, Wang, Zhenkun, Yao, Jianquan, Ishii, YukihiroVolume:
4919
Year:
2002
Language:
english
DOI:
10.1117/12.471873
File:
PDF, 120 KB
english, 2002