SPIE Proceedings [SPIE Speckle Metrology 2003 - Trondheim, Norway (Wednesday 18 June 2003)] Speckle Metrology 2003 - Speckle correlation used for measuring microstructural changes in paper
Sjodahl, Mikael, Larsson, Linda, Gastinger, Kay, Lokberg, Ole J., Winther, SveinVolume:
4933
Year:
2003
Language:
english
DOI:
10.1117/12.516572
File:
PDF, 232 KB
english, 2003