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SPIE Proceedings [SPIE Optics & Photonics 2005 - San Diego, California, USA (Sunday 31 July 2005)] Mathematical Methods in Pattern and Image Analysis - Comparison of binary phase-only filter (BPOF) against an extended normalized correlation method for face recognition
Astola, Jaakko T., Megherbi, D. B., Rastogi, Soumitra, Tabus, Ioan, Barrera, JuniorVolume:
5916
Year:
2005
Language:
english
DOI:
10.1117/12.624465
File:
PDF, 762 KB
english, 2005