SPIE Proceedings [SPIE SPIE Optics + Photonics - San Diego, California, USA (Sunday 13 August 2006)] Optical Systems Degradation, Contamination, and Stray Light: Effects, Measurements, and Control II - A numerical evaluation of the correlation of surface cleanliness level and percent area coverage
Perry III, Radford L., Uy, O. Manuel, Straka, Sharon A., Fleming, John C., Dittman, Michael G.Volume:
6291
Year:
2006
Language:
english
DOI:
10.1117/12.679621
File:
PDF, 231 KB
english, 2006