SPIE Proceedings [SPIE Optical Metrology - Munich, Germany...

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SPIE Proceedings [SPIE Optical Metrology - Munich, Germany (Monday 18 June 2007)] Optical Measurement Systems for Industrial Inspection V - Fourier-based design of asynchronous phase detection algorithms

Gómez-Pedrero, José A., Osten, Wolfgang, Gorecki, Christophe, Crespo, D., Quiroga, Juan A., Novak, Erik L.
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Volume:
6616
Year:
2007
Language:
english
DOI:
10.1117/12.725668
File:
PDF, 618 KB
english, 2007
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