Mechanical stress effect on the crystallization behavior of Ge 2 Sb 2 Te 5 films studied by electrical resistance measurement
Du, Yingchao, Kan, Yi, Lu, Xiaomei, Liu, Yunfei, Bo, Huifeng, Cai, Wei, Hu, Dazhi, Huang, Fengzhen, Zhu, JinsongVolume:
7
Language:
english
Journal:
physica status solidi (RRL) - Rapid Research Letters
DOI:
10.1002/pssr.201307167
Date:
July, 2013
File:
PDF, 487 KB
english, 2013