SPIE Proceedings [SPIE Sixth International Conference on...

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SPIE Proceedings [SPIE Sixth International Conference on Thin Film Physics and Applications - Shanghai, China (Tuesday 25 September 2007)] Sixth International Conference on Thin Film Physics and Applications - Study of the defects in GaN epitaxial films grown on sapphire by HVPE

Liu, Zhanhui, Xiu, Xiangqian, Chen, Lin, Zhang, Rong, Xie, Zili, Han, Ping, Shi, Yi, Gu, Shulin, Zheng, Youdou
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Volume:
6984
Year:
2007
Language:
english
DOI:
10.1117/12.792015
File:
PDF, 2.73 MB
english, 2007
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